GSO IEC 62047-16:2021
IEC 62047-16:2015
Gulf Standard
Current Edition
·
Approved on
01 July 2021
Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods
GSO IEC 62047-16:2021 Files
English
21 Pages
Current Edition
Reference Language
Obtaining this standard through the store is currently unavailable. You can acquire it directly from its source.
GSO IEC 62047-16:2021 Scope
IEC 62047-16:2015 specifies the test methods to measure the residual stresses of films with thickness in the range of 0,01 μ to 10 μ in MEMS structures fabricated by wafer curvature or cantilever beam deflection methods.
Best Sellers From Electrical Sector
YSMO GSO 2530:2023
GSO 2530:2016
Yemeni Technical Regulation
Energy Labelling And Minimum Energy Performance Requirements For Air-Conditioners
GSO 2530:2016
Gulf Standard
Energy Labelling And Minimum Energy Performance Requirements For Air-Conditioners
GSO 34:2007
Gulf Technical Regulation
LEAD-ACID STARTER BATTERIES USED FOR
MOTOR VEHICLES AND INTERNAL
COMBUSTION ENGINES
GSO 35:2007
Gulf Standard
Methods of test
for lead-acid starter batteries used for motor vehicles
and internal combustion engines
Recently Published from Electrical Sector
GSO 2770:2024
Gulf Standard
WATER HEATERS - ENERGY PERFORMANCE REQUIREMENTS
GSO IEC 61508-7:2024
IEC 61508-7:2010
Gulf Standard
Functional safety of electrical/electronic/programmable electronic safety-related systems - Part 7: Overview of techniques and measures (see Functional Safety and IEC 61508)
GSO IEC 62148-17:2024
IEC 62148-17:2023
Gulf Standard
Fibre optic active components and devices - Package and interface standards - Part 17: Transmitter and receiver components with dual coaxial RF connectors
GSO IEC 63027:2024
IEC 63027:2023
Gulf Standard
Photovoltaic power systems - DC arc detection and interruption