GSO IEC 60749-3:2014
IEC 60749-3:2002
Gulf Standard
Current Edition
·
Approved on
25 December 2014
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection
GSO IEC 60749-3:2014 Files
English
7 Pages
Current Edition
Reference Language
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GSO IEC 60749-3:2014 Scope
The purpose of this part of IEC 60749 is to verify that the materials, design, construction markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance, or both.
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