The purpose of this part of IEC 60749 is to test and determine the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive but should preferably be used for device qualification. If such devices are used for delivery, the effects of this highly accelerated stress test will need to be evaluated. In general, this test of storage at high temperature is in conformity with IEC 60068-2-48 but, due to specific requirements of semiconductors, the clauses of this standard apply.