GSO IEC 60749-13:2014

IEC 60749-13:2002
Gulf Standard   Current Edition · Approved on 25 December 2014

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

GSO IEC 60749-13:2014 Files

English 9 Pages
Current Edition Reference Language

GSO IEC 60749-13:2014 Scope

This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive In general, this salt atmosphere test is in conformity with IEC 60068-2-11 but, due to specific requirements of semiconductors, the clauses of this standard apply.

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