GSO IEC 62047-3:2014

IEC 62047-3:2006
Gulf Standard   Current Edition · Approved on 25 December 2014

Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing

GSO IEC 62047-3:2014 Files

English 15 Pages
Current Edition Reference Language

GSO IEC 62047-3:2014 Scope

This International Standard specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10 µm, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices. This International Standard is based on such a concept that a tensile testing system can be guaranteed in propriety and accuracy, when the measured tensile strengths of the standard test pieces, whose tensile strength is pre-determined, are within the designated range. It also specifies the test pieces to minimize characteristics deviation among the pieces.

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