GSO IEC 62047-3:2014
IEC 62047-3:2006
Gulf Standard
Current Edition
·
Approved on
25 December 2014
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
GSO IEC 62047-3:2014 Files
English
15 Pages
Current Edition
Reference Language
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GSO IEC 62047-3:2014 Scope
This International Standard specifies a standard test piece, which is used to guarantee the
propriety and accuracy of a tensile testing system for thin film materials with length and width
under 1 mm and thickness under 10 µm, which are main structural materials for microelectromechanical
systems (MEMS), micromachines and similar devices.
This International Standard is based on such a concept that a tensile testing system can be
guaranteed in propriety and accuracy, when the measured tensile strengths of the standard
test pieces, whose tensile strength is pre-determined, are within the designated range. It also
specifies the test pieces to minimize characteristics deviation among the pieces.
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