GSO IEC 60749-35:2014
IEC 60749-35:2006
Gulf Standard
Current Edition
·
Approved on
25 December 2014
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
GSO IEC 60749-35:2014 Files
English
43 Pages
Current Edition
Reference Language
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GSO IEC 60749-35:2014 Scope
This part of IEC 60749 defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. This standard provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.
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