GSO IEC 60749-22:2014

IEC 60749-22:2002
Gulf Standard   Current Edition · Approved on 25 December 2014

Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength

GSO IEC 60749-22:2014 Files

English 41 Pages
Current Edition Reference Language

GSO IEC 60749-22:2014 Scope

This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this part is to measure bond strength or determine compliance with specified bond strength requirements. NOTE This test is identical to the test method contained in clause 6 of chapter 2 of IEC 60749 (1996), amendment 1, apart from changes to this clause and renumbering

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