GSO IEC 62373:2014
IEC 62373:2006
Gulf Standard
Current Edition
·
Approved on
25 December 2014
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
GSO IEC 62373:2014 Files
English
27 Pages
Current Edition
Reference Language
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GSO IEC 62373:2014 Scope
This International Standard provides a test procedure for a bias-temperature (BT) stability test
of metal-oxide semiconductor, field-effect transistors (MOSFET).
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